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Editorial Board

IEEE Transactions on Reliability

Editor-in-Chief

Steven Li, Western New England University, USA
stevenli777@gmail.com

IEEE Transactions on Reliability Associate Editors
Iftekhar Ahmed University of California Irvine USA
J. Morris Chang University of South Florida USA
Yu-Wen Chen City College of Technology USA
Pau-Chen Cheng IBM T. J. Watson Research Division USA
Sabrina De Capitani di Vimercati Università degli Studi di Milano Italy
Joanna DeFranco Pennsylvania State University USA
Ruizhi Gao Sonos Inc. USA
Roberto Guanciale KTH Royal Institute of Technology Sweden
Abdelwahab Hamou-Lhadj Concordia University Canada
Chin-Yu Huang National Tsing Hua University Taiwan
Hsieh, Sun-Yuan National Cheng Kung University Taiwan
He Jiang Dalian University of Technology China
Hiroaki Kikuchi Meiji University Japan
Rick Kuhn Virginia Tech, National Institute of Standards and Technology (NIST) USA
Srdan Krstic ETH Zürich Switzerland
Phil Laplante Pennsylvania State University USA
Chi-Yu Li National Yang Ming Chiao Tung University Taiwan
Yingjiu (Joe) Li University of Oregon USA
Hui (Hugo) Lin University of Rhode Island USA
Yi-Kuei Lin National Yang Ming Chiao Tung University Taiwan
Yun Lin Harbin Engineering University China
Yu Liu University of Electronic Science and Technology of China China
David Lo Singapore Management University Singapore
Leo (Shyh-Wei) Luan IBM Almaden Research Center USA
Lei Ma University of Alberta Canada
Hon Keung Tony Ng Bentley University USA
Ed Pohl University of Arkansas USA
Alexander Pretschner Technical University of Munich Germany
Jason Rupe CableLabs USA
Yulei Sui University of New South Wales Australia
Hung-Min Sun National Tsing Hua University Taiwan
Sharareh Taghipour Toronto Metropolitan University Canada
Takeshi Takahashi National Institute of Information and Communication Technology Japan
Zhiyuan Tan Edinburgh Napier University UK
S. Felix Wu UC Davis USA
Yu-Sung (Hank) Wu National Yang Ming Chiao Tung University Taiwan
Ming-Hour Yang Chung Yuan Christian University Taiwan
Shunkun Yang Beihang University China
Zhisheng Ye National University of Singapore Singapore
Zheng Zheng Beihang University China
Haitao Liao University of Arkansas USA
Janet Lin Luleå University of Technology Sweden
Angelos Stavrou Virginia Tech USA
Huimin Wang Zhejiang Sci-Tech University China
Yisha Xiang University of Houston USA
Ruqiang Yan Xi'an Jiaotong University China
Wei-Chang Yeh National Tsing Hua University Taiwan
Ruolin Zhou UMass Dartmouth USA
Cheng-Chung William Chu Tunghai University/Fuyao University of Science and Technology Taiwan
David Coit Rutgers University USA
Yiming Deng Michigan State University USA
Tadashi Dohi Hiroshima University Japan
Yves LE TRAON University of Luxembourg Luxembourg
Shiuh-Pyng Winston Shieh National Yang Ming Chiao Tung University Taiwan
Hélène Waeselynck French National Centre for Scientific Research France
Shubin Si Northwestern Polytechnical University China
Tongdan Jin Texas State University USA
Yongzhi Qu University of Utah USA
Concetta Semeraro University of Sharjah UAE
Junliang Dong University of Arkansas USA
Tao Zhang Macau University of Science and Technology China
Mariela Cerrada Lozada Universidad Estatal de Milagro Ecuador
Naser Ezzati-Jivan Brock University Canada
Shen Yin Norwegian University of Science and Technology Norway
Guan Gui Nanjing University of Posts and Telecommunications China